Massachusetts Institute of Technology
EECS 6.720J — Integrated Microelectronic Devices
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Lecture 10 on Carrier Flow
EECS 6.720J · Massachusetts Institute of Technology
Short Metal-Oxide-Semiconductor Field-Effect Transistor Analysis
EECS 6.720J · Massachusetts Institute of Technology
Si Surface and the Metal-Oxide-Semiconductor Structure
EECS 6.720J · Massachusetts Institute of Technology
Analysis of the Long-Channel Metal-Oxide-Semiconductor FET
EECS 6.720J · Massachusetts Institute of Technology
Session Twelve: Analysis of Carrier Flow
EECS 6.720J · Massachusetts Institute of Technology
Project on Circuit Design and Device Characterization
EECS 6.720J · Massachusetts Institute of Technology
Field-Effect Transistor using Metal-Oxide-Semiconductor
EECS 6.720J · Massachusetts Institute of Technology
Lecture 3: Statistics of Carriers in Equilibrium
EECS 6.720J · Massachusetts Institute of Technology
P-N Junction (Lecture Thirteen)
EECS 6.720J · Massachusetts Institute of Technology
Compilation of Course Lectures
EECS 6.720J · Massachusetts Institute of Technology
Overview of Integrated Microelectronic Devices
EECS 6.720J · Massachusetts Institute of Technology
Carrier Flow: Drift and Diffusion
EECS 6.720J · Massachusetts Institute of Technology
Carrier Flow Discussion (Ninth Lecture)
EECS 6.720J · Massachusetts Institute of Technology
Semiconductor Electronic Structural Analysis
EECS 6.720J · Massachusetts Institute of Technology
Lecture 17: The Metal-Semiconductor Junction
EECS 6.720J · Massachusetts Institute of Technology
Transistors: Bipolar Junction Type
EECS 6.720J · Massachusetts Institute of Technology
First Quiz
EECS 6.720J · Massachusetts Institute of Technology
Junction Properties of Metal and Semiconductor
EECS 6.720J · Massachusetts Institute of Technology
Drift and Diffusion of Carriers
EECS 6.720J · Massachusetts Institute of Technology