What This Document Is
This is a homework assignment for ELENG 140, Linear Integrated Circuits, at the University of California, Berkeley. It focuses on the practical application of core concepts learned in the course, challenging students to design and analyze circuits. The assignment builds upon foundational knowledge of amplifier design and frequency response, requiring a detailed understanding of transistor behavior and circuit interactions. It appears to include questions originating from a past midterm exam, alongside new, related problems.
Why This Document Matters
This assignment is crucial for students seeking to solidify their understanding of linear integrated circuit design. It’s particularly beneficial for those preparing for exams or looking to deepen their practical skills. Working through these problems will help you translate theoretical knowledge into tangible circuit solutions and develop your analytical abilities. Successfully completing this assignment demonstrates a strong grasp of fundamental principles and prepares you for more advanced topics in the course. It’s best utilized *after* reviewing relevant lecture materials and textbook chapters.
Topics Covered
* NMOS and PMOS Amplifier Design
* Common Source Amplifier Configurations
* Low Frequency Gain and Unity Gain Frequency
* Output Swing and Supply Voltage Considerations
* Impedance Analysis (Input & Output)
* Capacitance Effects in Amplifiers
* Frequency Response of Amplifiers
* Transconductance (gm) and Output Resistance (ro)
* Single-Pole Amplifier Approximation
What This Document Provides
* Detailed problem statements requiring circuit design and analysis.
* Specific performance targets for amplifier circuits (gain, frequency response, output swing).
* Opportunities to apply circuit analysis techniques to determine impedance and capacitance.
* A chance to revisit and reinforce concepts from previous coursework, including a section based on a prior assignment.
* Guidance (in the form of “Useful things to think about”) to encourage deeper exploration of related circuit characteristics.
