What This Document Is
This document represents Lecture Seventeen from the Introduction to Microelectromechanical Systems (MEMS) course (ELENG 247A) at the University of California, Berkeley. It’s a focused exploration of Analog-to-Digital Converter (ADC) design, specifically delving into the critical aspects of the sampling process within these converters. This lecture provides a detailed examination of techniques used to achieve high-fidelity signal conversion, a cornerstone of many MEMS applications.
Why This Document Matters
This lecture is essential for students and engineers working with data acquisition systems, signal processing, and mixed-signal circuit design. It’s particularly valuable for those seeking a deeper understanding of the challenges and solutions related to accurately capturing analog signals for digital processing. If you are studying ADC architectures, seeking to optimize converter performance, or troubleshooting sampling-related issues, this material will provide a strong foundation. It builds upon prior knowledge of analog circuit fundamentals and prepares you for more advanced topics in data conversion.
Topics Covered
* Detailed analysis of sampling switch characteristics and considerations.
* Techniques for mitigating sampling imperfections like charge injection and clock feedthrough.
* Exploration of complementary switch configurations and their advantages.
* The impact of supply voltage scaling on sampling circuit performance.
* Methods for boosting gate voltages to improve sampling accuracy.
* Circuit implementations of constant voltage sampling techniques.
* Analysis of clock voltage doubler circuits used in sampling networks.
What This Document Provides
* In-depth discussion of practical sampling techniques and their limitations.
* Illustrative diagrams and circuit schematics to visualize key concepts.
* Examination of the relationship between sampling imperfections and signal distortion.
* Insights into optimizing sampling switch design for improved linearity and dynamic range.
* A focused look at circuit-level implementations for enhancing sampling performance.
* References to relevant research papers for further exploration of the topic.
