What This Document Is
This is a midterm examination for an introductory course in Microelectromechanical Systems (MEMS), specifically EECS 247 at the University of California, Berkeley. It’s designed to assess a student’s understanding of core principles and analytical skills related to the design and analysis of MEMS devices and systems. The exam focuses on applying theoretical knowledge to practical problems encountered in the field.
Why This Document Matters
This resource is invaluable for students currently enrolled in a similar MEMS course, or those preparing for related examinations. It’s particularly helpful for self-assessment, identifying knowledge gaps, and practicing problem-solving techniques under exam conditions. Reviewing a completed exam – once access is granted – can significantly improve understanding of expected problem types and the level of detail required in solutions. It’s best utilized *after* completing coursework and assigned readings to gauge preparedness.
Topics Covered
* Analog Filter Design & Analysis (Low-pass, High-pass, Band-pass)
* Operational Amplifier (Op-Amp) Characteristics & Impact on Circuit Performance
* Noise Analysis in MEMS Systems (Thermal Noise)
* Sampling Theory & Anti-Aliasing Techniques
* Analog-to-Digital Conversion (ADC) Principles & Performance Metrics
* Spectral Analysis & Signal Processing
* ADC Testing (SQNR, INL, DNL, SFDR, SNDR, ENOB)
* System-Level Considerations in MEMS Receiver Design
What This Document Provides
* A comprehensive set of problems covering key concepts in introductory MEMS.
* Opportunities to practice applying theoretical knowledge to quantitative problems.
* A range of problem types, from circuit analysis to system-level design considerations.
* A framework for understanding the trade-offs involved in MEMS system design.
* A detailed assessment of understanding of ADC performance parameters and testing methodologies.
