What This Document Is
This is a comprehensive tutorial designed to guide students through the operation of the HP 4145B/4155A/4155C Parameter Analyzer, a crucial piece of equipment used in the Microelectronic Devices and Circuits (ELENG 105) laboratory at UC Berkeley. It serves as a practical resource for understanding both the hardware and software aspects of this sophisticated testing instrument. The tutorial aims to build proficiency in utilizing the parameter analyzer for accurate circuit characterization and measurement.
Why This Document Matters
This tutorial is essential for any student enrolled in ELENG 105 who will be performing experiments requiring the use of the HP 4145B/4155A/4155C. It’s particularly valuable when you’re first learning to connect circuits, configure measurement settings, and interpret the data obtained from the analyzer. Mastering the concepts presented will significantly improve your lab efficiency and the quality of your experimental results. Access to the full tutorial will ensure you are well-prepared for successful lab work and a deeper understanding of device characteristics.
Topics Covered
* Detailed overview of the parameter analyzer’s capabilities and applications in circuit analysis.
* Explanation of the hardware interface, including the test fixture and its various terminals (SMU, VS, VM).
* In-depth exploration of the software interface used to control the parameter analyzer.
* Guidance on establishing connections between circuits and the analyzer’s terminals.
* Best practices for grounding and minimizing noise in measurements.
What This Document Provides
* A clear explanation of the function of each terminal within the test fixture.
* A walkthrough of the software setup process, including instrument selection and connection.
* Illustrations of the test fixture’s layout and numbering schemes.
* Information on the location of the necessary software on lab computers.
* A foundational understanding of how to prepare for and execute measurements using the HP 4145B/4155A/4155C.
