What This Document Is
This is a lab report assignment for Microfabrication Technology (ELENG 143) at the University of California, Berkeley. Specifically, it’s the second in a series of reports designed to assess your understanding of practical semiconductor device analysis techniques and how they relate to theoretical predictions. This report requires a collaborative effort, with students working in groups to submit a single, comprehensive analysis.
Why This Document Matters
This assignment is crucial for students enrolled in the Microfabrication Technology course. Successfully completing this report demonstrates proficiency in experimental procedures, data analysis, and the ability to critically evaluate results against established theory. It’s particularly valuable when you need to synthesize practical lab work with theoretical concepts, and understand potential discrepancies between expected and observed outcomes. This report will prepare you for more advanced work in semiconductor device characterization and fabrication.
Topics Covered
* Semiconductor device characterization methodologies
* Data acquisition and analysis techniques
* Comparison of experimental results with theoretical models
* Identification of potential sources of error in microfabrication processes
* Parameter extraction from device measurements
* Collaborative report writing and contribution assessment
* Academic integrity in scientific reporting
What This Document Provides
* A structured outline for organizing your lab report, including specific sections and point values.
* Guidance on addressing scenarios where experimental results deviate from expectations.
* A framework for detailing individual contributions to the group report.
* A template for an academic honesty declaration.
* Instructions regarding report submission deadlines and penalties for late submissions.
* A grading rubric to understand evaluation criteria.
